The Physics Of Atomic Force Microscopy - 1259 Words

Abstract Atomic Force Microscopy was the method used to analyze samples inorder to identify their surface composition and determine their top structure. Compiled data was used to calculate the roughness of the sample. Introduction Atomic Force Microscopy is a powerful tool used to identify the surface structure of a solid by contouring the top layer with a sharp tipped probe and amplifying the hills and troughs via laser reï ¬â€šection and detection. Piezoelec-tric materials are used to ï ¬ nely tune the x and y distance parameters, and a harmonic oscillator is utilized in close contact mode to move the cantilever in the z direction. A Scanning Probe Microscopy program processes the data and calculates the roughness of the sample Background Gustav Schmalz designed the first Optical Profiler in 1929 in Germany. He ran a probe attached to a cantilever across the surface, shined white light to a mirror attached to the probe, and amplified the signal to photographic film. The film was exposed to the reflected light of various wavelengths, causing multiple colors to show up on the film, corresponding to varying heights on the surface. This older design was subject to possible bending or crashing of the probe, causing a much lower resolution of the surface on the film. Refer to Figure 1.Show MoreRelatedPhysics : Atomic Force Microscopy1429 Words   |  6 PagesATOMIC FORCE MICROSCOPY 1. Introduction to Atomic Force Microscopy An atomic force microscope (AFM) is a type of scanning probe microscope (SPM). An AFM uses a cantilever with a probe to scan over a sample’s surface. The probe is a sharp tip (3 to 6 ï  ­m pyramid; 15 to 40 nm end radius) such as the one shown in Fig. 1. 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Developing graphene with specific structural properties depends upon controlling these defects, either by removing or deliberately engineering atomic structure to gain or tailoring specific properties. In the present article, a comprehensive review of defective graphene sheets with respect to its mechanical and thermal properties are presented and examined. Key Words: Graphene; point defects; lineRead MoreThe Theory Of Graphene On Science And Future Electronic Technology1905 Words   |  8 Pagesgraphene held together through weak Van der Waals forces.6 â€Å"Few-layer graphene† (very thin films of graphite, called FLG) was produced as early as 1948 by G. Ruess and F. 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